Accessories for Imaging Spectroscopic Ellipsometers

Wide Range of Accessories

Park Systems offers a comprehensive range of accessories for its Imaging Spectroscopic Ellipsometry, Referenced Spectroscopic Ellipsometry, and Brewster Angle Microscopy products.The accessories support extended measurement environments, specialized applications, and flexible system configurations. Additional or customized solutions beyond the standard catalog are available upon request.

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Objective Lenses

Interchangeable objective lenses enable adaptation of the lateral resolution and field of view to different measurement tasks in imaging ellipsometry.

SPR Cells

SPR cells enable kinetic surface analyses at solid–liquid interfaces, supporting in-situ observation of interfacial processes under controlled liquid-phase conditions.

Linkam Temperature Control Stage

The Linkam temperature control stage enables ellipsometric measurements under precisely defined temperature conditions for thermal and phase-transition studies.

Sample Handling Stages

Sample handling stages support accurate positioning and automated movement of samples, enabling reproducible measurements and large-area mapping.

Beam Cutter

The beam cutter suppresses disturbing backside reflections on transparent substrates, enabling artifact-free, non-destructive measurements.

Park Systems Imaging SpectroscopicEllipsometersLaser SafetyCabinet

Safety Enclosure

The safety enclosure provides laser protection for safe and compliant system operation.

Support Frame

The support frame ensures mechanical stability and precise system alignment, forming the basis for reliable high-resolution measurements.

Solid/Liquid Cells

The solid/liquid cell enables ellipsometric measurements at solid/liquid interfaces, supporting in-situ studies in liquid environments

Research AFM

Industrial AFM

Ellipsometer

Digital Holographic Microscopes

Active Vibration Isolation